Nanometrology 2020 International Conference

The 6th edition of NanoMetrology 2020 event deals with the advancements in all the metrological aspects related to nanoscience and nanotechnology. It is open to all the areas connected to both theoretical and experimental aspects of metrology at the nanometer scale, from new methodologies for the quantitative characterization of nanomaterials, to new results in fields of characterisation of nanomaterials and realisation of nanometrological standards, which represent a key issue for making possible a successful technological transfer of nanotechnology.

The aim of this event is to offer an opportunity to academicians, innovators and industrials to share, and divulge new methods, techniques and instrumentations, for metrology and characterisation of nanomaterials, nanosystems, and nanodevices at the nanometer scale.

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